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  FCH47N60NF 600v n-channel frfet ? mosfet ?2011 fairchild semiconductor corporation FCH47N60NF rev. c0 www.fairchildsemi.com 1 march 2013 FCH47N60NF n-channel supremos ? frfet ? mosfet 600 v, 45.8 a, 65 m features ? 650 v @t j = 150 o c ?typ.r ds(on) = 62 m ? ultra low gate charge (typ. q g = 240 nc) ? low effective output capacitance (typ. c oss .eff = 420 pf) ? 100% avalanche tested ? rohs compliant applications ? solar inverter ? ac-dc power supply description the supremos ? mosfet is fairchild semiconductor ? ?s next- generation of high voltage super-junction (sj) technology employing a deep trench filling proc ess that differentiate it from the conventional mosfets. th is advanced technology and pre- cise process control provide lo west rsp on-resistance, superior switching performance and ruggedne ss. supremos mosfet is suitable for high frequency switching power converter applica- tions such as pfc, server/telecom power, fpd tv power, atx power and industrial power appl ications. supremos frfet ? mosfet?s optimized body diode reverse recovery performance can remove additional component and improve system reliability. d g s g s d to-247 mosfet maximum ratings t c = 25 o c unless otherwise noted thermal characteristics symbol parameter FCH47N60NF unit v dss drain to source voltage 600 v v gss gate to source voltage 30 v i d drain current -continuous (t c = 25 o c) 45.8 a -continuous (t c = 100 o c) 28.9 i dm drain current - pulsed (note 1) 137.4 a e as single pulsed avalanche energy (note 2) 2926 mj i ar avalanche current 15.3 a e ar repetitive avalanche energy 3.7 mj dv/dt mosfet dv/dt ruggedness 100 v/ns peak diode recovery dv/dt (note 3) 50 v/ns p d power dissipation (t c = 25 o c) 368 w - derate above 25 o c2.94w/ o c t j , t stg operating and storage temperature range -55 to +150 o c t l maximum lead temperature for soldering purpose, 1/8? from case for 5 seconds 300 o c symbol parameter FCH47N60NF unit r jc thermal resistance, junction to case 0.34 o c/w r cs thermal resistance, case to heat sink (typical) 0.24 r ja thermal resistance, junction to ambient 40 *drain current limited by maximum junction temperature
FCH47N60NF 600v n-channel frfet ? mosfet www.fairchildsemi.com 2 ?2011 fairchild semiconductor corporation FCH47N60NF rev. c0 package marking and ordering information electrical characteristics t c = 25 o c unless otherwise noted off characteristics on characteristics dynamic characteristics switching characteristics drain-source diod e characteristics device marking device package reel size tape width quantity FCH47N60NF FCH47N60NF to-247 - - 30 symbol parameter test conditions min. typ. max. unit bv dss drain to source breakdown voltage i d = 1 ma, v gs = 0 v, t c = 25 o c 600 - - v bv dss t j breakdown voltage temperature coefficient i d = 1 ma, referenced to 25 o c - 0.78 - v/ o c i dss zero gate voltage drain current v ds = 480 v, v gs = 0 v - - 10 a v ds = 480 v, v gs = 0 v, t c = 125 o c - - 100 i gss gate to body leakage current v gs = 30 v, v ds = 0 v - - 100 na v gs(th) gate threshold voltage v gs = v ds , i d = 250 a3-5v r ds(on) static drain to source on resistance v gs = 10 v, i d = 23.5 a - 57.5 65.0 m g fs forward transconductance v ds = 40 v, i d = 23.5 a - 52 100 s c iss input capacitance v ds = 100 v, v gs = 0 v f = 1 mhz - 4600 6120 pf c oss output capacitance - 195 260 pf c rss reverse transfer capacitance - 3.0 5.0 pf c oss output capacitance v ds = 380 v, v gs = 0 v, f = 1 mhz - 108 - pf c oss eff. effective output capacitance v ds = 0 v to 380 v, v gs = 0 v - 492 - pf q g(tot) total gate charge at 10v v ds = 380 v, i d = 23.5 a, v gs = 10 v (note 4) - 121 157 nc q gs gate to source gate charge - 23 - nc q gd gate to drain ?miller? charge - 47 - nc esr equivalent series resistance(g-s) drain open - 0.9 - t d(on) turn-on delay time v dd = 380 v, i d = 23.5 a r gen = 4.7 (note 4) -3478ns t r turn-on rise time - 22 54 ns t d(off) turn-off delay time - 117 244 ns t f turn-off fall time - 4 18 ns i s maximum continuous drain to source diode forward current - - 47 a i sm maximum pulsed drain to source diode forward current - - 141 a v sd drain to source diode forward voltage v gs = 0 v, i sd = 23.5 a - - 1.2 v t rr reverse recovery time v gs = 0 v, i sd = 23.5 a di f /dt = 100 a/ s - 169 - ns q rr reverse recovery charge - 1.3 - c notes: 1. repetitive rating: pulse width limi ted by maximum junction temperature 2. i as = 15.3 a, r g = 25 , starting t j = 25 c 3. i sd 45.8 a, di/dt 1200 a/ s, v dd 380 v, starting t j = 25 c 4. essentially independent of operating temperature typical characteristics
FCH47N60NF 600v n-channel frfet ? mosfet www.fairchildsemi.com 3 ?2011 fairchild semiconductor corporation FCH47N60NF rev. c0 typical performance characteristics figure 1. on-region characteristics figure 2. transfer characteristics figure 3. on-resistance variation vs. figure 4. body diode forward voltage drain current and gate vo ltage variation vs. source current and temperature figure 5. capacitance characteristics figure 6. gate charge characteristics 2468 1 10 100 500 -55 o c 150 o c *notes: 1. v ds = 20v 2. 250 s pulse test 25 o c i d , drain current[a] v gs , gate-source voltage[v] 0.1 1 10 30 1 10 100 300 *notes: 1. 250 s pulse test 2. t c = 25 o c i d , drain current[a] v ds , drain-source voltage[v] v gs = 15v 10v 8v 6v 5v 0.40.60.81.01.21.4 1 10 100 400 *notes: 1. v gs = 0v 2. 250 s pulse test 150 o c i s , reverse drain current [a] v sd , body diode forward voltage [v] 25 o c 0 40 80 120 160 40 60 80 100 120 140 *note: t c = 25 o c v gs = 20v v gs = 10v r ds(on) [ m ] , drain-source on-resistance i d , drain current [a] 0.1 1 10 100 600 1 10 10 2 10 3 10 4 10 5 c oss c iss c iss = c gs + c gd ( c ds = shorted ) c oss = c ds + c gd c rss = c gd *note: 1. v gs = 0v 2. f = 1mhz c rss capacitances [pf] v ds , drain-source voltage [v] 0 20 40 60 80 100 120 140 0 2 4 6 8 10 *note: i d = 23.5a v ds = 120v v ds = 300v v ds = 480v v gs , gate-source voltage [v] q g , total gate charge [nc]
FCH47N60NF 600v n-channel frfet ? mosfet www.fairchildsemi.com 4 ?2011 fairchild semiconductor corporation FCH47N60NF rev. c0 typical performance characteristics (continued) figure 7. breakdown voltage variation figure 8. on-resistance variation vs. temperature vs. temperature figure 9. maximum safe operating area figure 10. maximum drain current vs. case temperature figure 11 . transient thermal response curve -100 -50 0 50 100 150 200 0.8 0.9 1.0 1.1 1.2 *notes: 1. v gs = 0v 2. i d = 1ma bv dss , [normalized] drain-source breakdown voltage t j , junction temperature [ o c ] r ds(on) , [normalized] drain-source on-resistance t j , junction temperature [ o c ] i d , drain current [a] t c , case temperature [ o c ] s 100 s 1ms 10ms i d , drain current [a] v ds , drain-source voltage [v] operation in this area is limited by r ds(on) *notes: 1. t c = 25 o c 2. t j = 150 o c 3. single pulse dc 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 1e-3 0.01 0.1 1 0.01 0.1 0.2 0.05 0.02 *notes: 1. z jc (t) = 0.34 o c/w max. 2. duty factor, d = t 1 /t 2 3. t jm - t c = p dm * z jc (t) 0.5 single pulse thermal response [ z jc ] rectangular pulse duration [sec] t 1 p dm t 2
FCH47N60NF 600v n-channel frfet ? mosfet www.fairchildsemi.com 5 ?2011 fairchild semiconductor corporation FCH47N60NF rev. c0 gate charge test circuit & waveform resistive switching test circuit & waveforms unclamped inductive switching test circuit & waveforms
FCH47N60NF 600v n-channel frfet ? mosfet www.fairchildsemi.com 6 ?2011 fairchild semiconductor corporation FCH47N60NF rev. c0 peak diode recovery dv/dt test circuit & waveforms dut v ds + _ driver r g same type as dut v gs ? dv/dt controlled by r g ?i sd controlled by pulse period v dd l i sd 10v v gs ( driver ) i sd ( dut ) v ds ( dut ) v dd body diode forward voltage drop v sd i fm , body diode forward current body diode reverse current i rm body diode recovery dv/dt di/dt d = gate pulse width gate pulse period -------------------------- dut v ds + _ driver r g same type as dut v gs ? dv/dt controlled by r g ?i sd controlled by pulse period v dd l l i sd 10v v gs ( driver ) i sd ( dut ) v ds ( dut ) v dd body diode forward voltage drop v sd i fm , body diode forward current body diode reverse current i rm body diode recovery dv/dt di/dt d = gate pulse width gate pulse period -------------------------- d = gate pulse width gate pulse period --------------------------
FCH47N60NF 600v n-channel frfet ? mosfet www.fairchildsemi.com 7 ?2011 fairchild semiconductor corporation FCH47N60NF rev. c0 mechanical dimensions to-247-3l dimensions in millimeters
FCH47N60NF 600v n-channel frfet ? mosfet www.fairchildsemi.com 8 ?2011 fairchild semiconductor corporation FCH47N60NF rev. c0 trademarks the following includes registered and unregistered trademarks and service marks, owned by fairch ild semiconductor and/or its gl obal subsidiaries, and is not intended to be an exhaustive list of all such trademarks. *trademarks of system general corporation, used under license by fairchild semiconductor. disclaimer fairchild semiconductor reserves the right to make changes with out further notice to any products herein to improve reliability, function, or design. fairchild does not assume an y liability arising out of th e application or use of any product or circuit described herein; neither does it convey an y license under its patent rights, nor the rights of others. these specifications do not expand the terms of fairchild?s wo rldwide terms and conditions , specifically the warranty therein, which covers these products. life support policy fairchild?s products are not authorized fo r use as critical components in life support devices or systems without the express written approval of fairchild semiconductor corporation. as used here in: 1. life support devices or systems ar e devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a sign ificant injury of the user. 2. a critical component in any com ponent of a life support, device, or system whose failure to perform can be reasonably ex pected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms 2cool? accupower? ax-cap ? * bitsic? build it now? coreplus? corepower? crossvolt ? ctl? current transfer logic? deuxpeed ? dual cool? ecospark ? efficentmax? esbc? fairchild ? fairchild semiconductor ? fact quiet series? fact ? fast ? fastvcore? fetbench? fps? f-pfs? frfet ? global power resource sm green bridge? green fps? green fps? e-series? g max ? gto? intellimax? isoplanar? marking small speakers sound louder and better? megabuck? microcoupler? microfet? micropak? micropak2? millerdrive? motionmax? mwsaver? optohit? optologic ? optoplanar ? powertrench ? powerxs? programmable active droop? qfet ? qs? quiet series? rapidconfigure? saving our world, 1mw/w/kw at a time? signalwise? smartmax? smart start? solutions for your success? spm ? stealth? superfet ? supersot?-3 supersot?-6 supersot?-8 supremos ? syncfet? sync-lock? ?* tinyboost? tinybuck? tinycalc? tinylogic ? tinyopto? tinypower? tinypwm? tinywire? transic ? trifault detect? truecurrent ? * serdes? uhc ? ultra frfet? unifet? vcx? visualmax? voltageplus? xs? ? ? datasheet identification product status definition advance information for mative / in design datasheet contains the design specifications for product development. specifications may change in any manner without notice. preliminary first production datasheet contains preliminary data; supplementary data will be published at a later date. fairchild semiconductor reserves the ri ght to make changes at any time without notice to improve design. no identification needed full production datasheet contains final specifications. fair child semiconductor re serves the right to make changes at any time without notice to improve the design. obsolete not in production datasheet contains specifications on a product t hat is discontinued by fairchild semiconductor. the datasheet is for reference information only. anti-counterfeiting policy fairchild semiconductor corporation?s anti-c ounterfeiting policy. fairchild?s anti-count erfeiting policy is also stated on our external website, www.fairchildsemi.com, under sales support . counterfeiting of semiconductor parts is a growing problem in the industry. all manuf actures of semiconductor products are expe riencing counterfeiting of their parts. customers who inadv ertently purchase counterfeit parts experience many problems such as loss of brand reputation, substa ndard performance, failed application, and increased cost of producti on and manufacturing delays. fairchild is taki ng strong measures to protect ourselve s and our customers from the proliferation of counterfeit parts. fairchild strongly encourages customers to purchase fairchild parts either directly from fa irchild or from authorized fairchild distributors who are listed by country on our web page cited above. product s customers buy either from fairchild directly or fr om authorized fairchild distributors are genuine parts, have full traceability, meet fairchild?s quality standards for handing and storage and provide access to fairchild?s full range of up-to-date technical and product information. fairchild and our authorized distributors will stand behind all warranties and wi ll appropriately address and warranty issues that may arise. fairchil d will not provide any warranty coverage or other assistance for pa rts bought from unau thorized sources. fairchild is committed to combat this global problem and encourage our customer s to do their part in stopping th is practice by buying direct or from authorized distributors. rev. i64 ?


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